Emergent phenomena at oxide interfaces studied with standing-wave photoelectron spectroscopy
Year: 2022
Type: article
Abstract: Emergent phenomena at complex-oxide interfaces have become a vibrant field of study in the past two decades due to the rich physics and a wide range of possibilities for creating new states of matter and novel functionalities for potential devices. The electronic-structural characterization of such phenomena presents a unique challenge due to the lack of direct yet nondestructive techniques for probing buried layers and interfaces with the required Ångstrom-level resolution, as well as element and orbital specificity. In this Review, we survey several recent studies wherein soft x-ray standing-wave photoelectron spectroscopy—a relatively newly developed technique—is used to investigate buried oxide interfaces exhibiting emergent phenomena such as metal-insulator transition, interfacial ferromagnetism, and two-dimensional electron gas. The advantages, challenges, and future applications of this methodology are also discussed.
DOI: 10.1116/6.0001584
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
Awards: G1229526393, G1286251239, G2371548206, G262532246, EMERGENT PHENOMENA AT MOTT INTERFACES - A TIME- AND DEPTH-RESOLVED APPROACH, G303061748, Physics: Atoms, Light, Matter, G392606314, G4235786860, G42916606, G4775162344, G495301720, G498139845, G5570207115, G6550344761, G6740987269, G7240651115, G7283024673, G7376787254, G8382000481, G911061179, G969889393
OpenAlex ID: W3209336253
