Work

Compositional Depth Profiling

Year: 2019

Type: other

DOI: 10.1002/9781119417651.ch4

Authors: John F. Watts, John Wolstenholme

Institution: University of Surrey

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4206645533

Cites:

Cited by: 1

Related to: 10