Work

Improving test quality of scan-based BIST by scan chain partitioning

Year: 2003

Type: conference-paper

Source: International Conference on Properties and Applications of Dielectric Materials (ICPADM)

DOI: 10.1109/ats.2003.1250773

Authors: Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Fujiwara

Institution: Tsinghua University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4239329966

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Cites: 1

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Related to: 10