Work

Full scan fault coverage with partial scan

Year: 2003

Type: conference-paper

Source: Design, Automation, and Test in Europe

DOI: 10.1109/date.1999.761167

Authors: Xijiang Lin, I. Pomeranz, S.M. Reddy

Institutions: Mentor Graphics (United States), University of Iowa

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4242822838

FWCI: 0.459

Cites: 24

Cited by: 5

Related to: 10