Work

MBIST-based Trim-Search Test Time Reduction for STT-MRAM

Year: 2022

Type: conference-paper

Source: Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium

DOI: 10.1109/vts52500.2021.9794178

Authors: Christopher Munch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori

Institution: Karlsruhe Institute of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Siemens

OpenAlex ID: W4282963817

FWCI: 1.81

Cites: 25

Cited by: 11

Related to: 10