Work

Scanning Electron Microscopy and X-Ray Microanalysis

Year: 1981

Type: book

Source: Springer eBooks

DOI: 10.1007/978-1-4613-3273-2

Authors: Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin

Institutions: Lehigh University, National Institute of Standards and Technology, University of Cambridge, National Institutes of Health, General Electric (United States)

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4302355088

FWCI: 5.118

Cites: 1

Cited by: 1,035

Related to: 10

Parts: 14