Work

Neural Fault Analysis for SAT-based ATPG

Year: 2022

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/itc50671.2022.00010

Authors: Junhua Huang, Hui-Ling Zhen, Naixing Wang, Hui Mao, Mingxuan Yuan, Yu Huang

Institution: Huawei Technologies (China)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4312956866

FWCI: 1.207

Cites: 30

Cited by: 6

Related to: 10