Work

Digital Semiconductor Testing Methodologies

Year: 2023

Type: conference-paper

Source: International Conference on Electronics and Sustainable Communication Systems (ICESC)

DOI: 10.1109/icesc57686.2023.10193103

Authors: Pallavi Deshpande, Vivek Epili, Gauri Ghule, Archana Ratnaparkhi, Shraddha Habbu

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4385451209

FWCI: 0.618

Cites: 13

Cited by: 4

Related to: 10