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Two-dimensional Search Space for Extracting Broadside Tests from Functional Test Sequences

Year: 2024

Type: article

Source: ACM Transactions on Design Automation of Electronic Systems

DOI: 10.1145/3650207

Author: Irith Pomeranz

Institution: Purdue University West Lafayette

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4392347992

FWCI: 0.233

Cites: 13

Cited by: 1

Related to: 10