Work

High-Dimensional Yield Analysis Using Sparse Representation for Long-Tailed Distribution

Year: 2024

Type: conference-paper

DOI: 10.1145/3670474.3685954

Authors: Ziqi Wang, Weihan Sun, Zhongxi Guo, Xiao Shi, Longxing Shi

Institution: Southeast University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402194579

FWCI: 0.311

Cites: 15

Cited by: 1

Related to: 10