Work

A Multifault Testing Method for TSVs Based on GAF-DRSN and Mirror Constant Current Source Structure

Year: 2024

Type: article

Source: IEEE Transactions on Components Packaging and Manufacturing Technology

DOI: 10.1109/tcpmt.2024.3456228

Authors: Yuling Shang, Longlu Geng, Chunquan Li, Zhuofan Song, Gefei Duan, Jintao Zhang, Junji Li

Institution: Guilin University of Electronic Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Foundation for Innovative Research Groups of the National Natural Science Foundation of China

Awards: G2964995679, G4616628276

OpenAlex ID: W4402351603

FWCI: 0.935

Cites: 29

Cited by: 3

Related to: 10