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A Low Power Scan Cell Design using FreePDK3

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Semiconductor Electronics

DOI: 10.1109/icse62991.2024.10681389

Authors: Ahmad Awalluddin Mohd Ghazali, Chia Yee Ooi, Hau Sim Choo, Nordinah Ismail, Siti Rahmah Aid

Institution: University of Technology Malaysia

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4402836050

FWCI:

Cites: 13

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Related to: 10