Work

In-Field Testing of Functionally-Possible Transition Faults With High Activation Frequencies

Year: 2024

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2024.3468710

Authors: Irith Pomeranz, Yervant Zorian

Institutions: Purdue University West Lafayette, Synopsys (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402895027

FWCI: 2.184

Cites: 27

Cited by: 7

Related to: 10