Work

SHAREDD: Sharing of Test Data and Design-for-Testability Logic for Transition Fault Tests under Standard Scan

Year: 2024

Type: article

Source: ACM Transactions on Design Automation of Electronic Systems

DOI: 10.1145/3698198

Author: Irith Pomeranz

Institution: Purdue University West Lafayette

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402949355

FWCI: 0.321

Cites: 25

Cited by: 1

Related to: 10