Work

In-Memory modelling and simulations

Year: 2024

Type: article

Source: Ìnformatika, kulʹtura, tehnìka.

DOI: 10.15276/ict.01.2024.26

Authors: Vladimir I. Hahanov, Svitlana V. Chumachenko, Eugenia I. Litvinova, Volodymyr I. Obrizan

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4403153525

FWCI:

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