Work

A Robust Test Architecture for Low-Power AI Accelerators

Year: 2024

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/tcad.2024.3476464

Authors: Hayoung Lee, Juyong Lee, Sungho Kang

Institutions: Ajou University, Yonsei University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Research Foundation of Korea

OpenAlex ID: W4403277948

FWCI: 1.25

Cites: 32

Cited by: 4

Related to: 10