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Innovative Multi-Bit Test Pattern Generators with Variable LFSR Selection Mechanisms

Year: 2024

Type: article

Abstract: Test Pattern Generators is an important module for testing Asynchronous circuits that guarantee fault detection. In this paper a multi-bit TPGs with tunable LFSR lengths is presented. Our method enables smooth transitions between various word lengths by dynamically selecting LFSR configurations based on control signals. For 4-bit to 7-bit combinational circuits, we have derived a polynomial-based LFSRs and shown effect of stuck-at-fault detections through extensive testing. It includes a discussion of instructional insights regarding fault coverage and digital circuit design. By bridging fixed and flexible BIST solutions, our adaptive TPG design improves fault detection capabilities.

Source: International Journal For Multidisciplinary Research

DOI: 10.36948/ijfmr.2024.v06i05.27683

Authors: ROOPA K R -, BRUNDA s KOTIAN -, Dhanya shree U -, Karunya P -, Shardul S -

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: hybrid

OpenAlex ID: W4403361328

FWCI: 0.962

Cites:

Cited by: 3

Related to: 10