Work

Solving Complex Electrical Fault Isolation Challenges with Innovative DFT Strategies

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0125

Authors: Lesly Endrinal, Rakesh Kinger, Wilson Pradeep, Shruti Mittal, Jehan Saujauddin, Sean Ho, Jyotika Suri, Atul Chittora, Mark Kassab, Peter Orlando

Institution: Google (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4403685843

FWCI: 0.644

Cites:

Cited by: 2

Related to: 10