Work

Analog Simulation and Fault Simulation for Failure Analysis of Analog Circuits

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024tpc1

Author: Tommaso Melis

Institution: STMicroelectronics (France)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403685857

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