Top-Down Junction Analysis in SiC
Year: 2024
Type: conference-paper
Authors: Gregory M. Johnson, Andreas Rummel, Pietro Paolo Barbarino, Giuseppe Sciuto, Massimiliano Astuto, Giancarlo Calvagno, Roberta Ricciari
Institution: STMicroelectronics (Italy)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403685987