Work

Design and Implementation of True Random Number Test Pattern Generator for Enhanced BIST Performance in Integrated Circuits

Year: 2024

Type: conference-paper

DOI: 10.1109/iacis61494.2024.10721833

Authors: Malavath Mamatha, V. Prithivirajan

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4403724316

FWCI:

Cites: 25

Cited by:

Related to: 10