Work

VLSI Test and Trust Roundtable

Year: 2024

Type: article

Source: IEEE Design and Test

DOI: 10.1109/mdat.2024.3444745

Authors: Ramesh Karri, Janusz Rajski, Rob Aitken, Subhasish Mitra, Mark M. Tehranipoor

Institutions: New York University, National Institute of Standards and Technology, Stanford University, University of Florida

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403758939

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