Work

A Reduced overhead Accumulator-based BIST scheme for Two-pattern generation

Year: 2024

Type: conference-paper

Source: South-East Europe Design Automation, Computer Engineering, Computer Networks and Social Media Conference (SEEDA-CECNSM)

DOI: 10.1109/seeda-cecnsm63478.2024.00012

Authors: E. Fotopoulos, S. Fatouros, A. Milidonis, I. Voyiatzis

Institution: University of West Attica

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403919946

FWCI:

Cites: 24

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Related to: 10