A Cost-Effective Per-Pin ALPG for High-Speed Memory Testing
Year: 2024
Type: article
Authors: Juyong Lee, Hayoung Lee, Sooryeong Lee, Sungho Kang
Institutions: Yonsei University, Ajou University
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Award: G7424216312
OpenAlex ID: W4404056580