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Analog Circuits Fault Diagnosis Based on Machine Learning

Year: 2024

Type: conference-paper

Source: IEEE International System-on-Chip Conference (SOCC)

DOI: 10.1109/socc62300.2024.10737721

Authors: Huapei Wang, Cheng Cai, Xuxin Chen, Fang Huo

Institution: Shanghai Dianji University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404057392

FWCI: 0.311

Cites: 14

Cited by: 1

Related to: 10