Work

An ICIM-CI Model for Mass Production Development Considering Manufacturing Variations

Year: 2024

Type: conference-paper

Source: International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

DOI: 10.1109/emccompo61192.2024.10742052

Authors: Hidetake Sugo, Norimasa Oka, Takaya Nagai, Koji Hattori, Takeshi Matsuzaki

Institution: Denso (Japan)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404103035

FWCI:

Cites: 5

Cited by:

Related to: 10