Work

Cost-Effective Analytical Models of Resistive Opens Defects in FinFET Technology

Year: 2024

Type: article

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

DOI: 10.1109/tvlsi.2024.3479068

Authors: Gustavo Aguirre, Freddy Forero, Victor Champac, Michel Renovell, Florence Azais, Mariane Comte, Jean-Marc Galliere

Institutions: National Institute of Astrophysics, Optics and Electronics, Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404238150

FWCI: 0.641

Cites: 23

Cited by: 2

Related to: 10