Work

Improved Scan Chain Stitching for Reducing Test Power

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics (DISCOVER)

DOI: 10.1109/discover62353.2024.10750747

Authors: Sai Sandeep Annamareddy, Navya Mohan

Institution: Amrita Vishwa Vidyapeetham

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404521288

FWCI: 0.644

Cites: 15

Cited by: 2

Related to: 10