Work

SPOT: Fast and Optimal Built-In Redundancy Analysis Using Smart Potential Case Collection

Year: 2024

Type: article

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

DOI: 10.1109/tvlsi.2024.3499955

Authors: Donghyun Han, Sunghoon Kim, Dayoung Kim, Sungho Kang

Institution: Yonsei University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Research Foundation of Korea

Award: G6321057740

OpenAlex ID: W4404787580

FWCI: 0.962

Cites: 25

Cited by: 3

Related to: 10