Work

Secondary electron emission from gold microparticles in a transmission electron microscope: comparison of Monte Carlo simulations with experimental results

Year: 2024

Type: article

Abstract: We measure the electron beam-induced current to analyze the electron-induced secondary electron (SE) emission from micron-sized gold particles illuminated by 80 and 300 keV electrons in a transmission electron microscope. A direct comparison of the experimental and simulated SE emission (SEE) employing Monte Carlo scattering simulations based on the GEANT4 toolkit yields overall good agreement with a noticeable discrepancy arising from the shortcoming of the GEANT4 scattering cross sections in the low-loss regime. Thus, the electron beam-induced current analysis allows to quantify the inelastic scattering including SEE in the transmission electron microscope and provides further insight into the charging mechanisms.

Source: Journal of Physics D Applied Physics

DOI: 10.1088/1361-6463/ad9840

Authors: Wen Feng, Johannes Schultz, Daniel Wolf, Sergii Pylypenko, Thomas Gemming, Kristina Weinel, Leonardo Agudo Jácome, Bernd Büchner, Axel Lubk

Institutions: Leibniz Institute for Solid State and Materials Research, Federal Institute For Materials Research and Testing, Technische Universität Dresden

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $3,165

OpenAlex ID: W4404797527

FWCI: 0.565

Cites: 44

Cited by: 6

Related to: 10