Work

Safety-Guided Test Generation for Structural Faults

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00043

Authors: Xuanyi Tan, Dhruv Thapar, Deepesh Sahoo, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty, Rubin Parekhji

Institutions: Arizona State University, Texas Instruments (India)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Semiconductor Research Corporation

OpenAlex ID: W4404847829

FWCI: 0.311

Cites: 19

Cited by: 1

Related to: 10