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Unsupervised Learning Provides Intelligence for Testing Hard to Detect Faults

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00010

Authors: Soham Roy, Vishwani D. Agrawal

Institutions: Intel (United States), Auburn University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404847837

FWCI: 0.621

Cites: 31

Cited by: 2

Related to: 10