Work

Adaptive Diagnosis Points for 100% Chain Diagnosis Coverage

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00033

Authors: Wu-Tung Cheng, Manish Sharma, Xin Yang, Artur Stelmach, Szczepan Urban, Jakub Janicki, Preston McWithey

Institution: Siemens (Germany)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404847851

FWCI: 1.558

Cites: 35

Cited by: 5

Related to: 10