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Probe Card Ground Noise Canceling Circuit

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00019

Authors: Seongkwan Lee, Minho Kang, Cheolmin Park, Jun Yeon Won, Jaemoo Choi, Chanyeol Park, Sunyong Park, Woonphil Yang

Institutions: Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404847896

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