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A Scalable & Cost Efficient Next-Gen Scan Architecture: Streaming Scan Test via NVIDIA MATHS

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00062

Authors: Kunal Jain Mangilal, Mahmut Yilmaz, Vishal Agarwal, Shantanu Sarangi, Kaushik Narayanun

Institution: Nvidia (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404847944

FWCI: 0.621

Cites: 5

Cited by: 2

Related to: 10