AI-Enabled Board Level Vibration Testing: Unveiling The Physics of Degradation
Year: 2024
Type: conference-paper
Authors: Varun Thukral, Chen He, Rebecca Chen, Letian Zhang, Romuald Roucou, Michiel Van Soestbergen, Jeroen Zaal, Rene Rongen, Willem Van Driel, G.Q. Zhang
Institutions: Delft University of Technology, NXP (United States), NXP (France)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404847945