Work

Diagnosis of Defects on Global Signals

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00049

Authors: Xinyang Zhao, Baohua Wang, Yin Zhang, Weiming Zhang, Xiaotian Ding, Yu Huang

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404848178

FWCI:

Cites: 12

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Related to: 10