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From Hybrid to Integrated: The Evolution of DFT Integration in SoC Design at Intel

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00012

Authors: Brian Pajak, Pankaj Pant, Vidya Neerkundar

Institution: Intel (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404848412

FWCI:

Cites: 2

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Related to: 10