Work

Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00017

Authors: Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi Tahoori, Sani Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian

Institutions: Karlsruhe Institute of Technology, Rheinland-Pfälzische Technische Universität Kaiserslautern-Landau, Synopsys (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404848498

FWCI: 0.935

Cites: 16

Cited by: 3

Related to: 10