Work

Optimized Instruction Set Architecture for Programmable Memory Test Pattern Generation

Year: 2024

Type: conference-paper

Source: International SoC Design Conference

DOI: 10.1109/isocc62682.2024.10762495

Authors: Seokmin Park, Jewoo Park, Young-Woo Lee

Institutions: Inha University, Hyundai Motor Group (South Korea), Hyundai Motors (South Korea)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404848540

FWCI: 0.322

Cites: 5

Cited by: 1

Related to: 10