Virtual Test Development Using Pre-Silicon Verification Environment
Year: 2024
Type: conference-paper
Authors: E. Aderholz, Q. Atol, B. Baptist, R. Holzner, R. Ignacio, V. Kamanuri, A. Kun, K. Ma, B. Mariacher, O. Pfabigan, A. Przybilla, D. Samardzic, F. Schlagbauer, M. Schleicher, J.P. Valiente, E. Vargas, K. Vinod, O. Zikulnig
Institution: Infineon Technologies (Germany)
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404848557