Work

APAPG: Address Pre-Processed ALPG for High-Speed Linear Test

Year: 2024

Type: conference-paper

Source: International SoC Design Conference

DOI: 10.1109/isocc62682.2024.10762567

Authors: Sooryeong Lee, Hayoung Lee, Juyong Lee, Sungho Kang

Institution: Yonsei University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404848570

FWCI:

Cites: 3

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Related to: 10