Work

An All-Digital Standard-Cell-Based Resistive-Sensing Display Panel/Chip Crack Detector

Year: 2024

Type: conference-paper

Source: International SoC Design Conference

DOI: 10.1109/isocc62682.2024.10762016

Authors: Hyunwook Lee, Hee-Cheol Joo, Seung Chae Jung, Seunghoon Yi, Young-Ha Hwang

Institution: Soongsil University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Research Foundation, Korea Institute for Advancement of Technology

OpenAlex ID: W4404848618

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