Work

Scalable BIST for Linearity Testing of Sigma-Delta Modulators

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00021

Authors: Krishna Pramod Madabhushi, Trevor LaBanz, Sudip Dandnaik, Eslam Hag

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404848620

FWCI: 0.322

Cites: 4

Cited by: 1

Related to: 10