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A graph-based algorithm for NVM address decoders testing

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00064

Authors: Pierre Scaramuzza, Thomas Kern, Matteo Coppetta, Alessandro Grossi, Rudolf Ullmann

Institution: Infineon Technologies (Germany)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404848946

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Cites: 14

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Related to: 10