Work

Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00013

Authors: Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich

Institutions: University of Stuttgart, Paderborn University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404848977

FWCI: 2.253

Cites: 29

Cited by: 7

Related to: 10