Work

Functionally-Possible Gate-Exhaustive Bridging Faults

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00014

Author: Irith Pomeranz

Institution: Purdue University West Lafayette

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404848986

FWCI: 0.322

Cites: 17

Cited by: 1

Related to: 10