Work

MBIST-based MRAM defect screening for safety-critical applications

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00057

Authors: Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi Tahoori

Institution: Karlsruhe Institute of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404849005

FWCI: 0.322

Cites: 28

Cited by: 1

Related to: 10