Work

Small-Bridging-Fault-Aware Built-In-Self-Repair for Cycle-Based Interconnects in a Chiplet Design Using Adjusted Pulse-Vanishing Test

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00046

Authors: Chi Lai, Shi-Yu Huang

Institution: National Tsing Hua University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: Ministry of Science and Technology, National Science and Technology Council

OpenAlex ID: W4404849241

FWCI:

Cites: 16

Cited by:

Related to: 10