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A Fast, Statistical, Machine-learning Approach for Automotive Semiconductor Test Reduction

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00032

Authors: Mehul D. Shroff, Nguyen Nguyen, Kiran Sunny Thota

Institution: NXP (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404849242

FWCI: 0.318

Cites: 16

Cited by: 1

Related to: 10